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CH

Nano Science

Metal Analysis

Environmental Research

Safety Detection

Geological Sciences

Photovoltaics

Semiconductor

Elemental Analysis: Optical Emission Spectrometers; In-Line XRF Analyzers; Handheld XRF Spectrometers; X-Ray Coating Analysis; TXRF Spectrometers; Micro-XRF Spectrometers; EPR Instruments; Itrax Core Scanner; Information Management Systems

Surface Analysis: Stylus Profilometers; 3D Optical Microscopes; Nanomechanical Test Instruments; Tribometers and Mechanical Testers; Atomic Force Microscopes

Solar Energy Detection/Semiconductor: Film Stress; Film Adhesion

General Equipment: DANTE DPP (digital pulse processor); Charge Sensitive Preamplifier CUBE; PV/I-V Test; Coating Thickness Gauges; AFM Probes

Your current location is：home??>??Product Center??>??Stylus Profilometers

Product Center

Stylus Profilometers

BRUKER STYLUS PROFILOMETER - Dektak Pro
Dektak Pro delivers accurate, precise data with the highest resolution, lowest n.....
Dektak XT
The DektakXT? stylus profiler features a revolutionary design that enables unmat.....
Dektak XTL Stylus Profiler System
Large-Format Wafer and Panel Measurement

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Contact Us

Tel：86-021-37018108

Fax：86-021-57656381

Email：info@boyuesh.com

Address：Room 301, 28 Songjiang Hi-tech park, 518 Xinzhuan Road, Songjiang District, Shanghai

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Copyright © 2013 Boyue instrument (Shanghai) Co., Ltd.?Copyright Record No：滬ICP備10038023號-1

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