天天看天天爽天天摸天天添,欧美中文字幕,97公开免费视频,狠狠综合久久综合网站,国产午夜在线观看视频,国产成人女人在线视频观看

Elemental Analysis: Optical Emission Spectrometers; In-Line XRF Analyzers; Handheld XRF Spectrometers; X-Ray Coating Analysis; TXRF Spectrometers; Micro-XRF Spectrometers; EPR Instruments; Itrax Core Scanner; Information Management Systems

Surface Analysis: Stylus Profilometers; 3D Optical Microscopes; Nanomechanical Test Instruments; Tribometers and Mechanical Testers; Atomic Force Microscopes

General Equipment: DANTE DPP (digital pulse processor); Charge Sensitive Preamplifier CUBE; PV/I-V Test; Coating Thickness Gauges; AFM Probes

Your current location is：home??>??Product Center??>??Surface Analysis

Product Center

BRUKER STYLUS PROFILOMETER - Dektak Pro
Dektak Pro delivers accurate, precise data with the highest resolution, lowest n.....
Dektak XT
The DektakXT? stylus profiler features a revolutionary design that enables unmat.....
Dektak XTL Stylus Profiler System
Large-Format Wafer and Panel Measurement
TI 980 TriboIndenter
Bruker's most advanced nanomechanical and nanotribological test instrument
Dimension FastScan
The new benchmark for speed with highest resolution and performance
ContourGT-X
Automated, gauge-capable metrology for R&D and production

< 1 2 3 >

Online Message

Tel：86-021-37018108

Fax：86-021-57656381

Email：info@boyuesh.com

Address：Room 301, 28 Songjiang Hi-tech park, 518 Xinzhuan Road, Songjiang District, Shanghai

Scan code attention

<del id="q2uig"></del>

<fieldset id="q2uig"></fieldset>

<abbr id="q2uig"></abbr>