The Best-Value Research AFM

Providing complete AFM capabilities to fit your budget

     The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

Routine High-Resolution Imaging

       All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance andclosed-loop positioning.Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

Fast Setup for Every Experiment

       The patented top-down optics of the Innova integrate seamlessly with all imaging modes. With softwarecontrolled optical zoom, they provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

       It offers a unique, state-of-the-art closed-loop scan linearization system that ensures accurate measurements and noise levels approaching those of open-loop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns without the need to change scanner hardware. The integrated, high-resolution color optics and programmable, motorized Z-stage make finding features and changing tips or samples fast and easy.

·  Offering lowest noise and highest AFM resolution in its class

·  Delivering an economical solution with complete AFM capabilities

·  Offering easy setup and fast time to research-quality results

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Contact our application team immediately: 021-37018108, info@boyuesh.com